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QWED Sp. z o.o. New Products
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Measurement of low loss ceramics
Company:
QWED Sp. z o.o.
Sapphire Resonator for testing of copper foils at 13 / 21 GHz
Company:
QWED Sp. z o.o.
Portable setup for measurement of dielectric properties of materials
Company:
QWED Sp. z o.o.
2D Scanner for mapping of dielectric properties of silicon wafers
Company:
QWED Sp. z o.o.
Portable setup for testing of substrate and packaging materials
Company:
QWED Sp. z o.o.
Dielectric measurements with a Fabry-Perot open resonator (up to 130 GHz)
Company:
QWED Sp. z o.o.
2D Scanner for Imaging of High-resistivity Materials
Company:
QWED Sp. z o.o.
10GHz surface imaging of low-resistivity semiconductors
Company:
QWED Sp. z o.o.
Precise characterization of liquid materials in 1 - 50 GHz range
Company:
QWED Sp. z o.o.
Material measurement with Q-Meter
Company:
QWED Sp. z o.o.
