Tue, Mar 18, 2025 - 10:00 AM to 12:00 PM
S05: Assembly Processes and Testing 1: Component & Assembly Characterization
Instructor/Speaker: Mr. Neil Hubble, President, Akrometrix
Instructor/Speaker: Dr. Jose Servin, Material Expert, Vitesco
Instructor/Speaker: Dr. Reza Ghaffarian, Principal Engineer, JPL
Instructor/Speaker: Prof. Sebastian Fischmeister, PhD, Co-founder and CEO, Palitronica
General Committee: Assembly Processes and Testing
Event Type: Technical Conference Session
Location: 304C
Detection of HiP of Burn-in FCBGA by Thermal Cycle
Solder Graping Issue Analysis
Alternative Methods in Measuring BGAs for Thermal Warpage
Early Defect Detection with a Scalable Broad-Spectrum Test Using Radiofrequency Reflectometry