Sun, Mar 16, 2025 - 9:00 AM to 12:00 PM
PD01:Field Reliability of Microelectronics - Perspectives and Approaches using Physics of Failure and Risk Based Decision Making, Part One
Instructor/Speaker: Dr. Bhanu Sood, Deputy Center Chief Technologist, NASA Goddard Space Flight Center
Focus: QUALITY & RELIABILITY
Event Type: Professional Development
Location: 303A
PD01 - part 1
