As the electronics industry makes use of thinner coatings, manufacturers increase their demands for technologies to accurately and reliably measure complex surface finishes. X-ray fluorescence (XRF) instruments are the method of choice to meet these demands. Fischer's XRF instruments enable simultaneous thickness and compositional measurement on every surface finish such as IAg, ISn, ENIG and ENEPIG. Fischers leading Hardware and Software technology allows for the measurement of the % Phosphorous content in Electroless Nickel even under the Gold and Palladium layers in ENEPIG, EPIG finishes.
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